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Dark Current Analysis of Vertical p-i-n Photodetectors on a Germanium-on-Insulator Platform

机译:绝缘体上锗平台上垂直p-i-n光电探测器的暗电流分析

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Dark current of vertical p-i-n photodetectors on a germanium-on-insulator platform was analyzed. The activation energy was found to be from 0.15 to 0.36 eV under reserve bias. The dark current generation was interpreted by Shockley-Read-Hall and trap-assisted-tunneling effects. This work provides the interpretation on germanium-on-insulator photodetectors and suggests the alternative to suppress the dark current generation for Si-based Ge photodetectors.
机译:分析了绝缘体上锗平台上垂直p-i-n光电探测器的暗电流。发现在储备偏压下活化能为0.15至0.36eV​​。 Shockley-Read-Hall和陷阱辅助隧穿效应解释了暗电流的产生。这项工作提供了绝缘体上锗光电探测器的解释,并提出了抑制基于Si的Ge光电探测器产生暗电流的替代方案。

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