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Inferring the Probability Distribution of the Electromagnetic Susceptibility of Equipment from a Limited Set of Data

机译:推断设备电磁易感性的概率分布从有限的数据集中推断出设备的电磁易感性

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摘要

Failure risk assessment of electronic equipment to an electromagnetic aggression is the cornerstone of Intentional Electromagnetic Interference (IEMI). Such a failure may occur if the electromagnetic constraint reaches a threshold that is likely to produce a dysfunction. Due to the production variability of electric/electronic equipment under analysis, its susceptibility level may be considered as a random variable. Estimation of its distribution through susceptibility measurements of a limited set of available equipment is required. We compare the performance of the Bayesian Inference (BI) and the Maximum Likelihood Inference (MLI) according to their ability to choose the true distribution for different sample size, when the true distribution is theoretically known. Then we compare the performance of the BI and the MLI on a virtual electronic device for which the true distribution is not known a priori. We finally discuss the respective benefits of BI and MLI in estimating the failure probability of equipment.
机译:电子设备对电磁侵略的故障风险评估是故意电磁干扰(IEMI)的基石。如果电磁约束达到可能产生功能障碍的阈值,则可能发生这种失败。由于在分析下的电/电子设备的生产变化,其易感水平可以被认为是随机变量。需要通过易受可用设备的易受测量测量来估计其分布。我们将贝叶斯推理(BI)和最大似然推理(MLI)的性能进行比较,根据它们选择不同样本大小的真实分布,当真实分布是已知的时,根据不同的样本大小的能力。然后,我们将BI和MLI的性能进行比较,虚拟电子设备上的真实分布不知道先验。我们终于讨论了BI和MLI的各自益处,估计设备的失效概率。

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