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A fixture de-embedding method for material S-parameters measurement

机译:用于材料S参数测量的夹具去嵌入方法

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The material S-parameter is one of the important parameters, for that it characterizes material electromagnetic properties like μ and ε. The fixture is usually used for the S-parameter measurement, but the fixture will cause the embedding error during the process of measurement. Thus, it is important that the embedding error should be eliminated for improving the S-parameter accuracy as more as possible. The measurement system is mapped into the cascade model of port network, and five states of cascade network are designed. Then, state equations can be built to solve fixture S-parameters problem. The result is proved that the proposed method of S-parameter de-embedding is feasible. And the simulation result shows that the maximum deviation between the calculated value and the physical simulated value is less than 2dB from 0.1 to 1.5 GHz.
机译:材料S参数是重要的参数之一,因为它表征了材料的电磁特性,例如μ和ε。夹具通常用于S参数的测量,但是夹具会在测量过程中引起嵌入误差。因此,重要的是应消除嵌入误差,以尽可能地提高S参数的精度。将测量系统映射到端口网络的级联模型中,设计了级联网络的五种状态。然后,可以建立状态方程来解决夹具的S参数问题。结果证明,所提出的S参数去嵌入方法是可行的。仿真结果表明,在0.1至1.5 GHz范围内,计算值与物理仿真值之间的最大偏差小于2dB。

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