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Defect detection in metallic structures through AMR C-scan images using deep learning method

机译:使用深度学习方法通​​过AMR C扫描图像检测金属结构中的缺陷

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Failure analysis in metal structures prior to the arrival of the specimen to the boundary of instability is one of the most important issues in the industry. Hence, the importance of the Non-Destructive Evaluation (NDE) techniques which work with high accuracy and efficiency ability in detecting the defects is rapidly increasing. Given the fact that most of the existing equipment are made of conductive and magnetic materials, therefore, the electromagnetic fields can be used for defect detection. In this study, we present utilization of a Deep Learning method for characterization of defect areas in a specimen through x, y and z planes C-scan images. Due to its low noise sensitivity and ability to operate at low frequencies, an Anisotropic Magnetoresistive (AMR) sensor is employed for the sampling of a magnetic field over specimen surface to provide C-scan images. Next, for sizing the defect existed in the specimen, a Deep Convolutional Neural Network (DCNN) is designed and implemented for the obtained C-scan images. Finally, the validation of the obtained DCNN is carried out and its efficiency in identification of defect characteristics is compared to traditional neural networks (NNs). The most significant advantage of DCNN is related to its ability in automatic extraction of learning features from the data applied to the network depending on the problem, which here it leads to an improvement in the accuracy of the defect analysis relative to the other traditional NNs.
机译:在样品到达不稳定性边界之前对金属结构进行失效分析是行业中最重要的问题之一。因此,以高精度和高效率能力工作的无损评估(NDE)技术在检测缺陷中的重要性正在迅速提高。鉴于大多数现有设备都是由导电和磁性材料制成的事实,因此,电磁场可用于缺陷检测。在这项研究中,我们介绍了通过x,y和z平面C扫描图像表征样品中缺陷区域的深度学习方法。由于它的低噪声灵敏度和在低频下运行的能力,因此采用各向异性磁阻(AMR)传感器对样本表面上的磁场进行采样,以提供C扫描图像。接下来,为了确定样本中存在的缺陷的大小,针对获得的C扫描图像设计并实现了深度卷积神经网络(DCNN)。最后,对获得的DCNN进行验证,并将其在识别缺陷特征方面的效率与传统的神经网络(NN)进行比较。 DCNN的最显着优势与它根据问题自动从应用于网络的数据中提取学习特征的能力有关,在这里,与其他传统的NN相比,它可以提高缺陷分析的准确性。

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