Investigation of properties thin films ZnO and SnO2 prepared with spray pyrolysis

摘要

We performed a comparative study of properties of the two oxides films ZnO and SnO2 deposed by the spray pyrolysis technique prepared at 400 °C of deposition temperature and a deposition time equal to 10 min with the concentration of 0.1 mol/l, in order to optimize the precursor which allows having a high conductivity and high transmittance. Several techniques were used for the structural, morphological, optical and electrical characterization of the films. The characterization XRD showed that the SnO2 film have cubic phase with preferential orientation (111) with a crystallite size equal to 57 * 10⁻⁹ m. For the film of ZnO is polycrystalline in nature and the crystallite size at 12 * 10⁻⁹ m. The transmittance is about 71 % for the films deposited with SnO2 and around 81 % for films prepared ZnO these films confirms that it is possible to obtain good transparent; the gap value obtained at 3.83 eV for SnO2 and 3.21 eV for ZnO. The refractive indexes were determined by ellipsometric measurements we have obtained values in the order of 2.304 and 2.146 for SnO2 and ZnO films respectively. The measurement of the electrical resistivity also showed that the resistivity value of the ZnO thin film improved by over that of the SnO2 film, is a remarkable result the use for photovoltaic applications.