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A Single-Temperature-Calibration 0.18-μm CMOS Time-Based Resistive Sensor Interface with Low Drift over a ?40°C to 175°C Temperature Range

机译:单温校准0.18-μmCMOS时代电阻传感器接口,低漂移在Δ40°C至175°C温度范围内

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This paper presents a very-low-drift 0.18μ m CMOS time-based resistive-bridge sensor interface. It exhibits only 3.8 ppm/° C gain drift and 0.3 ppm/°C offset drift for the entire -40°C to 175°C temperature range using a single-temperature calibration scheme and no external accurate references nor components. The interface provides a 15 ENOB for a 100ms conversion time, consuming 3.41mW of power and 0.26mm2 of active area. The holistic drift-resilience strategy combines time-based chopping and VCO tuning to remove the DC and low-frequency errors introduced by VCO nonidealities and drift.
机译:本文介绍了一个非常低漂移的0.18μMCMOS时基电阻桥传感器接口。它仅表现出3.8ppm /°C增益漂移和整个-40°C的0.3ppm /°C偏移漂移,使用单温校准方案,无需外部准确的参考资料和组件。该接口提供了15个ENOB,可为100ms转换时间,消耗3.41MW的功率和0.26mm 2 活跃区域。整体漂移 - 弹性战略结合了基于时间的斩波和VCO调谐,以消除VCO NonInities和Drift引入的直流和低频误差。

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