首页> 外文会议>Chinese Control Conference >ARL Study of Second Order Autocorrelation Residual Control Chart and its Application in MAP
【24h】

ARL Study of Second Order Autocorrelation Residual Control Chart and its Application in MAP

机译:二阶自相关残差控制图的ARL研究及其在MAP中的应用

获取原文

摘要

The average run chain length under different autocorrelation parameters was calculated by Markov chain method. Compared with the traditional Shewhart control chart, the performance was better and the influence of sequence correlation was basically eliminated. At the same time, the residual control chart of the design is validated once again by using the real data generated from the measurement assurance scheme. The residual control chart effectively reduces the fluctuation caused by the non-abnormal causes and reduces the false alarm. Further illustrates the effectiveness of its elimination sequence correlation.
机译:采用马尔可夫链法计算了不同自相关参数下的平均游程链长。与传统的Shewhart控制图相比,其性能更好,并且基本上消除了序列相关性的影响。同时,使用从测量保证方案生成的实际数据再次验证设计的剩余控制图。残差控制图有效地减少了非正常原因引起的波动,减少了误报。进一步说明了其消除序列相关性的有效性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号