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Simulation-Based MDP Verification for Leading-Edge Masks

机译:基于模拟的领先掩模MDP验证

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For IC design starts below the 20nm technology node, the assist features on photomasks shrink well below 60nm and the printed patterns of those features on masks written by VSB eBeam writers start to show a large deviation from the mask designs. Traditional geometry-based fracturing starts to show large errors for those small features. As a result, other mask data preparation (MDP) methods have become available and adopted, such as rule-based Mask Process Correction (MPC), model-based MPC and eventually model-based MDP. The new MDP methods may place shot edges slightly differently from target to compensate for mask process effects, so that the final patterns on a mask are much closer to the design (which can be viewed as the ideal mask), especially for those assist features. Such an alteration generally produces better masks that are closer to the intended mask design. Traditional XOR-based MDP verification cannot detect problems caused by eBeam effects. Much like model-based OPC verification which became a necessity for OPC a decade ago, we see the same trend in MDP today. Simulation-based MDP verification solution requires a GPU-accelerated computational geometry engine with simulation capabilities. To have a meaningful simulation-based mask check, a good mask process model is needed. The TrueModel~? system is a field tested physical mask model developed by D2S. The GPU-accelerated D2S Computational Design Platform (CDP) is used to run simulation-based mask check, as well as model-based MDP. In addition to simulation-based checks such as mask EPE or dose margin, geometry-based rules are also available to detect quality issues such as slivers or CD splits. Dose margin related hotspots can also be detected by setting a correct detection threshold. In this paper, we will demonstrate GPU-acceleration for geometry processing, and give examples of mask check results and performance data. GPU-acceleration is necessary to make simulation-based mask MDP verification acceptable.
机译:对于IC设计开始于20nm技术节点下方,光掩模的辅助功能缩远低于60nm,并由VSB EBEAM作家编写的掩模上的打印模式开始显示掩模设计的大偏差。基于传统的基于几何的压裂开始为这些小功能显示大错误。结果,其他掩模数据准备(MDP)方法已获得和采用,例如基于规则的掩模过程校正(MPC),基于模型的MPC和最终基于模型的MDP。新的MDP方法可以从目标略微不同地放置射击边缘以补偿掩模过程效果,从而掩模上的最终图案更靠近设计(可以被视为理想的掩码),特别是对于那些辅助功能。这种改变通常产生更好的掩模,更接近预期的掩模设计。基于传统的基于XOR的MDP验证无法检测到eBeam效果引起的问题。几十年前,我们认为,基于模型的OPC验证,我们在今天的MDP中看到了相同的趋势。基于仿真的MDP验证解决方案需要具有模拟能力的GPU加速的计算几何发动机。要具有有意义的基于模拟的掩模检查,需要一个很好的掩模过程模型。 truemodel〜?系统是由D2S开发的现场测试的物理掩模模型。 GPU加速的D2S计算设计平台(CDP)用于运行基于仿真的掩模检查,以及基于模型的MDP。除了基于模拟的检查之外,如掩模EPE或剂量余量,还可以使用基于几何的规则来检测诸如SLIVES或CD分裂等质量问题。通过设置正确的检测阈值,也可以检测剂量裕度相关热点。在本文中,我们将展示GPU - 加速几何处理,并举例说明掩模检查结果和性能数据。 GPU-加速是使仿真的掩模MDP验证所必需的。

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