STUDY ON DE-EMBEDDING APPROACH OF NON-COAXIAL MICROWAVE DEVICE TEST FIXTURES

摘要

With the development of mobile communication technologies, the application of 5G key technologies such as large-scale antennas, full-spectrum access, and high-frequency millimeter waves will drive the RF devices to be synchronously upgraded, and the packaging of RF devices is getting smaller and smaller. How to accurately test RF devices Performance parameters become more and more difficult. It must design test fixtures for RF devices to accurately test the performance parameters of RF devices. This article uses the powerful modeling and computational capabilities of HFSS (High Frequency Structure Simulator) to design non-coaxial microwave test fixtures and calibration devices. To study the EMC characteristics of the fixture and to optimize the fixture structure, the TRL (Thru-Reflect-Line) calibration method is used to correct the system error introduced by the test fixture during testing of the microwave device so as to obtain the accurate S parameter of the microwave device. At last, the TRL calibration algorithm is compiled by Matlab to test the verification pieces, through the verification test pieces show that, the S11 in the calibration result is small, both below −20 dB, indicating that there is almost no signal reflection; S21 is close to 0, indicating that there is almost no signal insertion loss. The designed test fixtures and fixture calibration pieces allow accurate and rapid testing of non-coaxial RF devices.