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Energy Efficient Write Verify and Retry Scheme for MTJ Based Flip-Flop and Application

机译:基于MTJ的触发器的节能写验证重试方案及其应用

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A non-volatile flip-flop (NVFF) introducing MTJ has many strong points in high endurance and read/write performance, and hence is very attractive as a component to be used for power gating of sequential circuits. However, large write-energy to MTJ becomes a big obstacle in achieving low energy dissipation. This paper proposes a NVFF circuit enabling to verify the success of a store operation to MTJ and retry it by prolonging the store time. We designed a NVFF circuit with this feature and applied it to 20,000 flip-flops in a dynamically reconfigurable processor (DRP). We conducted simulations considering write time variations caused by various factors such as process variations and thermal fluctuations. The results demonstrated that the proposed approach reduces store energy by 35-36% at four image-processing applications and the break-even time (BET) for non-volatile power gating is 2.0-2.9μs at the 0.004% write error rate, at which no failures occur for the total number of NVFFs in the DRP.
机译:引入MTJ的非易失性触发器(NVFF)在高耐用性和读/写性能上具有许多优点,因此,作为用于时序电路电源门控的组件,它非常有吸引力。然而,向MTJ写入大量能量成为实现低能耗的一大障碍。本文提出了一种NVFF电路,该电路能够验证对MTJ的存储操作是否成功,并通过延长存储时间来重试该操作。我们设计了具有此功能的NVFF电路,并将其应用于动态可重配置处理器(DRP)中的20,000个触发器。我们进行了模拟,考虑了由各种因素(例如工艺变化和热波动)引起的写入时间变化。结果表明,在四种图像处理应用中,该方法可将存储能量降低35-36%,并且在0.004%的写入错误率下,非易失性电源门控的收支平衡时间(BET)为2.0-2.9μs。对于DRP中的NVFF总数,不会发生任何故障。

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