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Qualification of Gate drivers for Operation of High Voltage SiC MOSFETs and IGBTs

机译:用于高压SiC MOSFET和IGBT的栅极驱动器的资格鉴定

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Smaller switching loss at higher switching frequency makes the 10kV and 15kV SiC MOSFETs and IGBTs competent to the medium voltage application. Due to exposure to fast voltage transitions at such high voltage level (10kV and 15kV), the gate drivers used in operation suffer through various challenges including insulation problems and common mode currents in power supply. Failure of gate drivers at such a high voltage may lead to catastrophic damage to the converter and surroundings. Therefore, it requires to qualify the gate drivers performance at 10kV to 15kV voltage level before implementing them in field operation. This paper describes an organized methodology for the qualification of gate drivers for High voltage SiC MOSFETs and IGBTs at higher switching frequency up to 20kHz.
机译:在较高的开关频率下较小的开关损耗使10kV和15kV SiC MOSFET和IGBT能够胜任中压应用。由于暴露于如此高的电压电平(10kV和15kV)下的快速电压转换,操作中使用的栅极驱动器面临各种挑战,包括绝缘问题和电源中的共模电流。栅极驱动器在如此高的电压下发生故障可能会导致转换器和周围环境的灾难性损坏。因此,在现场运行之前,要求在10kV至15kV电压水平下验证栅极驱动器的性能。本文介绍了一种有组织的方法,用于在高达20kHz的更高开关频率下鉴定高压SiC MOSFET和IGBT的栅极驱动器。

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