Ageing processes in one-, two- and three-layered thick films based on modified thermistor ceramics

摘要

The ageing kinetics (thermally-induced drift of electrical resistance) in one-, two- and three-layered temperature sensitive thick-film structures based on Cu_0,1Ni0,₁Co_1,6Mn_1,2O₄ and Cu_0,1Ni₀,₈Co₀,₂Mn₁,₉O₄ ceramics were investigated. It is established that two processes are activated in the one-layered thick-film elements: burning of organic components between spinel grains and simultaneous penetration in released area metallic silver. The own ageing processes are character for two-layered thick films that occur in an increasing in electrical resistance. Kinetics are adequately described by extended exponentially-power function. Three-layered thick film elements are stable in a time after degradation transformations.