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Particle measurements with liquid-borne particle counters: Effects of counting efficiency

机译:使用液体颗粒计数器进行颗粒测量:计数效率的影响

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Liquid extraction of semiconductor tool components followed by particle measurements with a liquid-borne particle counter (LPC) is an effective method to determine surface particle contamination on parts. As device geometries continue to shrink, nanoparticles (100 nm or smaller) have attracted more and more attention. Unfortunately, light-scattering based counters capable of measuring these nanoparticles operate at Less Than Perfect Counting Efficiency (<100%, LTPCE) due to design limitations. With limited understanding of this limitation, testing results from different labs with different counters can be drastically different and thus confusing. This work studies the effect of counting efficiency on measurement results through comparative measurements with counters of different counting efficiencies. This study showed counting efficiency affects measurement accuracy significantly but has limited or no effect on measurement precision on the same counter. The effect of counting efficiency on accuracy depends on the composition of the particle as well as particle size and/or distribution. It is difficult to find a universal and straightforward way to correct the adverse effect of LTPCE in order to achieve standardized particle measurements among those counters.
机译:液体萃取半导体工具部件,然后使用液载颗粒计数器(LPC)进行颗粒测量是确定零件表面颗粒污染的有效方法。随着器件几何形状的不断缩小,纳米颗粒(100纳米或更小)已引起越来越多的关注。不幸的是,由于设计限制,能够测量这些纳米粒子的基于光散射的计数器的工作效率低于完美的计数效率(<100%,LTPCE)。在对此限制的有限了解下,来自具有不同计数器的不同实验室的测试结果可能会截然不同,从而造成混乱。这项工作通过使用具有不同计数效率的计数器进行比较测量来研究计数效率对测量结果的影响。这项研究表明,计数效率会显着影响测量精度,但对同一计数器的测量精度影响有限或没有影响。计数效率对精度的影响取决于颗粒的组成以及颗粒大小和/或分布。很难找到一种通用且直接的方法来纠正LTPCE的不利影响,以便在这些计数器中实现标准化的颗粒测量。

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