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Pitting Corrosion of Copper Tubes for Drinking Water Applications Due to Silicate Films

机译:硅酸盐薄膜对饮用水用铜管的点蚀

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Copper is a well-established material for water transport. Sometimes pitting corrosion could appear. In the last few years some serious failures in cold water tubes in one special region in Germany have been observed. The appearance of silicate films at the metal surface has been detected. Measurements with the Scanning Kelvin Probe and Scanning Vibrating Electrode do show the existence of local anodes under artificially prepared silicate films on copper. At the phase boundary between the silicate film and the untreated copper surface, the free corrosion potential shows the most negative value. Interestingly this anode is surrounded by the cathode formed by the free copper surface and also by a cathodic area represented by the complete silicate covered copper surface. Galvanostatic investigations do show that the mechanism of copper dissolution is changed. The formation of Cu~(2+) -ions is hindered, only Cu~+ ions can be formed under thick silicate films. Moreover the existence of the silicate film hinders the copper to form a protective oxide film. The copper dissolution is higher than without a silicate film. Without a silicate film at the surface, the copper dissolution decreases with exposition time. This is the first time that the mechanism of pitting corrosion of copper in cold water due to the formation of silicate films has been proofed.
机译:铜是用于水运输的公认材料。有时会出现点蚀。最近几年,德国一个特殊地区的冷水管出现了一些严重故障。已经检测到金属表面上的硅酸盐膜的外观。用扫描开尔文探针和扫描振动电极进行的测量确实显示了在铜上人工制备的硅酸盐膜下存在局部阳极。在硅酸盐膜和未处理的铜表面之间的相界处,自由腐蚀电位显示最大负值。有趣的是,该阳极被由自由铜表面形成的阴极以及由完整的硅酸盐覆盖的铜表面所代表的阴极区域所包围。恒电流研究确实表明,铜溶解的机制已改变。阻碍了Cu〜(2+)离子的形成,在厚的硅酸盐膜下只能形成Cu〜+离子。此外,硅酸盐膜的存在阻碍了铜形成保护性氧化物膜。铜的溶解度高于没有硅酸盐膜的溶解度。在表面上没有硅酸盐膜的情况下,铜的溶解度随暴露时间而降低。这是首次证明了由于硅酸盐膜的形成而导致的冷水中铜点蚀的机理。

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