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Retrieving the reflection coefficient of a sample from the frequency response of a special open resonator

机译:从特殊开放式谐振器的频率响应中检索样品的反射系数

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This paper focuses on accurate measuring the electromagnetic reflection at K band from flat samples made of a composite material or a metal mesh. A special open resonator comprising a sample under test features a good sensitivity due to multiple reflections in the cavity and absence of any contact between the sample and the installation. Data processing algorithm arises from geometric optics description of the microwave field in the resonator. Digital modeling with the CST Microwave Studio software and real experiments with use of ZVA50 signal analyzer confirmed efficiency of the proposed technique.
机译:本文着重于精确测量由复合材料或金属网制成的扁平样品在K波段的电磁反射。包含待测样品的特殊开放式谐振器具有良好的灵敏度,这是因为腔中多次反射并且样品与设备之间没有任何接触。数据处理算法源自谐振器中微波场的几何光学描述。使用CST Microwave Studio软件进行数字建模以及使用ZVA50信号分析仪进行的实际实验证实了所提出技术的效率。

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