Metrological measurements using programmable Josephson Voltage Standard

摘要

In this study, Programmable Josephson Voltage Standard established in UME is used in static and dynamic ADC characterization, and solid state voltage standard calibration. Model functions of the measurements are created including the stray components in the measurement circuit. Uncertainties of the measurements are evaluated according to the model functions. Software tools and mathematical tools for investigating the quantum state of the measurements are presented. Gain difference between the static and dynamic gain parameters is suggested to be used for digital metrology.