Vulnerability of secured IoT memory against localized back side laser fault injection

摘要

Devices aimed for the Internet of Things (loT) market are required to be both low cost and highly secured, as they are expected to be integrated in ordinary "things" while storing and processing sensitive information. In this paper we examine the vulnerabilities of a commercial secured IoT memory chip to precise and localized back-side laser fault injection. We explain the different steps needed in order to prepare the sample, and describe the laser fault injection setup. From the experiments we conclude that the chip relies mostly on physical countermeasures which renders obsolete in this kind of attack. Further more, the experiments stress the necessity for sophisticated Error Detecting Codes in order to efficiently protect the integrity of the sensitive information stored and processed in the chip.