A new method to measure the dielectric constant in complex electromagnetic environment with black-box modeling regression method

摘要

In this paper, a novel black-box modeling multiband regression(BMMR) approach is presented for measuring the dielectric constant, overcoming the difficulty of measuring the dielectric constant in complex real environment with existing methods. In this approach, a simplified model based on black-box theory is built to obtain the field strengths within a certain frequency range of different dielectric constants. And a one-to-one mapping relation between dielectric constant and field intensity of the material to be measured in a certain frequency band is established by curve fitting. The dielectric constant of the material could be got through nonlinear regression equation of the standard curve by KNN (k-nearest neighbors) if its field strength is determined. Experimental results show that the BMMR methodology can calculate the dielectric constant accurately, which is especially appropriate for measuring the dielectric constant in a complex electromagnetic environment. In addition, BMMR make it possible to measure the dielectric constant by scanning.