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Spectral, Directional Emittance at Elevated Temperatures for Various Materials

机译:各种材料在高温下的光谱定向辐射

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Material samples of stainless steel and titanium with different surface roughness values were investigated to determine their spectral directional emissivity at elevated temperatures up to 1,200 K in the visible to near infrared wavelength range (VIS/NIR) and in the infrared (IR) around 4 μm. This work supports experiments for the investigation of transition from laminar to turbulent flow and the resulting heat flux augmentation with particular respect to isolated and distributed surface roughness in the Ballistic Range Facility at NASA Ames Research Center. The measurements of spectral directional surface emissivity were accomplished by measuring the radiation from an appropriately designed test specimen in a furnace heating facility with optical access. The blackbody radiation, needed to determine the emissivity, was generated through a cavity in the specimen itself. During the time of measurement, the sample was shielded from the furnace radiation through a retractable cold radiation shield. The potential effect of sample emission reflected from this radiation shield was investigated in a separate setup using Joule heated samples. No significant influence of this irradiation on the measured sample emission was seen so far. In the VIS/NIR, a 500 mm focal length spectrometer was used for detection. The specimen surface was imaged on the spectrometer entrance slit enabling the simultaneous measurement of a sample normal to the viewing direction, the blackbody cavity, and a tilted sample. In the IR, a FLIR camera with a band pass filer transmitting between 3.8 and 4 μm was used to image the tests specimen. In general, surface roughness was found to increase emissivity significantly in comparison to polished samples of the same material. The actual roughness values seem to have only a minor effect The measured emissivities show only a weak variation with temperature.
机译:研究了具有不同表面粗糙度值的不锈钢和钛材料样品,以确定在高达1200 K的高温下从可见光到近红外波长范围(VIS / NIR)和约4μm的红外光谱(IR)的光谱方向发射率。这项工作支持进行实验,以研究从层流到湍流的过渡以及由此产生的热通量的增加,特别是在美国宇航局艾姆斯研究中心的弹道靶场设施中隔离和分布的表面粗糙度方面。光谱定向表面发射率的测量是通过在带有光通道的炉子加热设备中测量来自适当设计的试样的辐射来完成的。确定发射率所需的黑体辐射是通过样品本身的空腔产生的。在测量期间,通过可伸缩的冷辐射屏蔽罩将样品与炉子的辐射屏蔽。使用焦耳加热的样品在单独的设置中研究了从此辐射防护屏反射的样品发射的潜在影响。到目前为止,还没有发现这种辐射对测得的样品发射有显着影响。在VIS / NIR中,使用500毫米焦距光谱仪进行检测。样品表面在光谱仪入口狭缝上成像,从而可以同时测量垂直于观察方向的样品,黑体腔和倾斜的样品。在红外中,使用带通滤镜在3.8和4μm之间传输的FLIR相机对测试样品成像。通常,与相同材料的抛光样品相比,发现表面粗糙度显着提高了发射率。实际的粗糙度值似乎只有很小的影响。测得的发射率仅显示出随温度的微弱变化。

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