首页> 外文会议>Annual meeting of the American Society for Precision Engineering >DEVELOPMENT OF WHITE LIGHT SCANNING INTERFEROMETRY FOR FREEFORM SURFACE METROLOGY
【24h】

DEVELOPMENT OF WHITE LIGHT SCANNING INTERFEROMETRY FOR FREEFORM SURFACE METROLOGY

机译:自由曲面测量的白光扫描干涉测量技术的发展

获取原文

摘要

Freeform surfaces may be classified as complex geometrical features which have no invariance degree. The term 'freeform' is generally used for surfaces without any rotational symmetry. A variety of methods have been suggested for diffusely reflecting freeform surfaces metrology; however, it is much more difficult to measure the shape of specular freeform surfaces, since the surfaces themselves are not visible. We only see their effect from the reflection of incoming light. The measurement of specular surfaces can be done by CMM (Coordinate Measuring Machine) or interferometric means, as shown in Figure 1.
机译:自由曲面可以分类为没有不变度的复杂几何特征。术语“自由形式”通常用于没有任何旋转对称性的表面。已经提出了多种方法来漫反射自由曲面的度量。但是,测量镜面自由曲面的形状要困难得多,因为这些曲面本身是不可见的。我们仅从入射光的反射中看到它们的效果。镜面的测量可以通过CMM(坐标测量机)或干涉仪进行,如图1所示。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号