Post-manufacturing 'one-shot' calibration of analog/RF circuits based on non-intrusive sensors

摘要

Deep sub-micrometer CMOS technologies drive a large proportion of innovation in many industries, including transport, communications, biological sensors, and medical systems. The trend nowadays is to integrate analog/RF circuits together on the same die with the digital processor and memory in advance process nodes. A major challenge is that the amount of process variation becomes particularly pronounced, causing measurable and predictable variance in the output performance especially in the case of analog/RF circuits.