Various wearout mechanisms have both a reversible and an irreversible (permanent) part, with some, like BTI and EM having a significant reversible part, while others, like HCI, being mostly irreversible. In this paper we make two contributions. First, we show that the boundary between the reversible and irreversible parts of wearout is not fixed, with the irreversible part becoming at least partially reversible under the right conditions of active accelerated recovery and stress/recovery scheduling. Second, we show that there are certain stress/recovery schedules that can (almost) completely eliminate irreversible wearout, thus allowing significant reductions in necessary design margins. The experiments were done on commercial FPGAs fabricated in a 40nm technology. To fully repair and avoid the irreversible wearout, we propose a biology-inspired sleep-when-getting-tired strategy. The strategy can achieve >60× design margin reduction and ~9% average performance improvement within a 10-year lifetime constraint compared to the no-recovery case. Potential system level implementations (a negative “turbo-boost” like strategy) in multicore and NoC systems are also presented.
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