Microwave holography measurement based on the active surface system of large reflector antenna

摘要

A novel application of active surface is proposed for the diagnosis of large reflector antenna. In this method, the active surface system is not only a compensation equipment but also used for getting multiple far field patterns. Using the flexibility of actuators, this method can get more diversified phase factor than traditional methods. A detail description and flowchart of the method are presented in this paper. Finally, a comparison between active deformation of primary reflector and defocus of sub-reflector on the effect of phase retrieval algorithm is discussed to prove the effectiveness of the proposed method.