Prediction of Smart Meter Life Assessment Based on Weibull Distribution

摘要

Due to the difficulty for accurate assessment for reliable life-span of smart meters under operating status, this paper has come up with a two-dimensional index of "life-span and reliability" to assess the reliability of smart meters and has ensured the life-span distribution rule for smart meters by the data from accelerated degradation test based on generalized multiple-stress model on the basis of common method of reliability prediction in the system analysis. By analyzing the relationship between environment stress and parameters from the Weibull distribution, this paper has established a new multiple-stress degradation model based on log-linear regression model, come up with method for parameter correction for the new model, realized the solution solving for parameters in life-span distribution model under normal stress level and has required the prediction results for the reliable life-span and remaining life-span of smart meters under normal stress level.