ESTIMATING THE COMPLEX INDEX OF REFRACTION BASED ON THE ROUGH SURFACE POLARIZATION DEGREE

摘要

The complex index of refraction was the fixed characteristic of the target material. In the remote sense field, the complex index of the refraction is a useful parameter for classify and recognize the material. To detect the complex index of the refraction of the opaque material was difficult. A new method of estimating the complex refraction index based on the measured polarization degree of the material according to the different incident angle of reflectance angle was provided. The result showed that the stability and reliability of the acquired complex refraction index was fine.