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Working towards the development of a standardized artificial soiling method

机译:致力于开发标准化的人工污染方法

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Solar glass coatings for photovoltaic (PV) modules include antireflection and antisoiling coatings. There are increasing number of claims related to dust resistant, abrasion resistant (during cleaning) and self-cleaning solar glass coatings. Currently, there is no standardized way of verifying the validity of such claims. As a first step towards validating such claims, the industry needs to develop a standardized artificial soiling method with actual laminated module construction of glass / EVA / cell / EVA / backsheet. This paper presents an approach for working towards the development of a standardized artificial soiling method for laminated photovoltaic (PV) cells or mini-modules. In this study, poly-Si mini-modules and single-cell mono-Si coupons were soiled and characterized using I-V, reflectance and quantum efficiency (QE) to calculate the effect of soiling on performance. From the results, the technique was found to be repeatable and soil pattern was uniform for both mini-modules and single cell coupons. The study compares poly-Si mini-modules with single-cell mono-Si to identify the ideal coupon for artificial soiling. Poly-Si mini-modules proved to be a good measure of soil uniformity, as any non-uniformity would effect the smoothness of curve at near Isc during I-V measurements. Single-cell mono-Si was identified to be more suitable for reflectance and QE measurements. This study indicates that the reflectance measurements between 600-700 nm wavelengths can be used as a direct measure to determined soil density on the modules.
机译:用于光伏(PV)组件的太阳能玻璃涂层包括抗反射和抗污涂层。涉及防尘,耐磨性(清洁过程中)和自清洁太阳能玻璃涂层的索赔越来越多。当前,没有标准化的方法来验证此类声明的有效性。作为验证此类要求的第一步,行业需要开发一种标准化的人工污染方法,以玻璃/ EVA /电池/ EVA /底片的实际层压模块结构进行制造。本文提出了一种方法,致力于开发用于层压光伏(PV)电池或微型模块的标准化人工污染方法。在这项研究中,使用I-V,反射率和量子效率(QE)对多晶硅微型模块和单电池单硅试样进行污染和表征,以计算污染对性能的影响。从结果中,发现该技术是可重复的,并且对于微型模块和单细胞试样,土壤模式是一致的。这项研究将多晶硅微型模块与单电池单硅进行了比较,以确定用于人工污染的理想试样。多晶硅微型模块被证明是衡量土壤均匀性的好方法,因为任何不均匀性都会影响I-V测量过程中Isc附近曲线的平滑度。已确定单电池单晶硅更适合反射率和QE测量。这项研究表明,可以将600-700 nm波长之间的反射率测量值用作确定模块上土壤密度的直接方法。

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