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Prediction of near-field shielding effectiveness for conformal-shielded SiP and measurement with magnetic probe

机译:保形SiP的近场屏蔽效果预测和磁探针测量

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This paper presents a fast prediction method to evaluate the near-field shielding effectiveness (SE) for conformal-shielded System-in-Packages (SiP). By revising the typical EM method to meet SiP circumstances, the near-field SE can be quickly estimated. A simple conformal-shielded SiP module is designed. To experimentally verify the proposed method, two kinds of metallic shielding materials, copper and nickel, are sputtered on the module with different coating thicknesses. In the near-field, the measured SE reaches up to 52 dB for 4-µm copper coating as well as 54 dB for 15-µm nickel coating. The predicted results are closely agreed with simulations and measurements from 0.01 and 1 GHz.
机译:本文提出了一种快速预测方法,用于评估保形屏蔽的系统级封装(SiP)的近场屏蔽效果(SE)。通过修改典型的EM方法以满足SiP情况,可以快速估计近场SE。设计了一个简单的保形屏蔽SiP模块。为了通过实验验证所提出的方法,将两种金属屏蔽材料(铜和镍)溅射到具有不同涂层厚度的模块上。在近场中,对于4 µm的铜涂层,测得的SE高达52 dB,对于15 µm的镍涂层,测得的SE高达54 dB。预测结果与0.01和1 GHz的仿真和测量结果非常吻合。

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