Development of structure function analysis system for power semiconductor devices

摘要

In this paper, a structure function analysis system consist of two parts: lower machine and upper machine is developed. The lower machine provides the devices under test (DUT) a variable temperature environment and precise current in the test, in the meanwhile, the forward voltage is recorded. The upper machine is mainly used to transfer the test parameters to lower machine by Labview and process the data information send from lower machine by Matlab, which can further obtain the structure function of DUT. The developed structure function analysis system can test the K coefficient and cooling curve, and calculate the structure function, which shows detailed thermal resistance and thermal capacity information of DUT. It's meaningful and promising to develop the structure function analysis system with low cost and high efficiency.