Characterization of integrated semiconductor optical amplifiers in the JePPIX multi-project wafer platform

摘要

Several research institutes and commercial foundries presently offer shared wafer processing services based on generic integration technology. We have characterized SOAs fabricated in such a platform and compare their performance to discrete devices fabricated in a dedicated commercial process. Despite some limitations (presently single polarization and only C-band available), the characteristics of the integrated SOAs come quite close to their discrete counterparts.