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Absolute distance measurement using frequency-comb-referenced four-wavelength interferometry

机译:使用频率梳参考的四波长干涉仪进行绝对距离测量

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We measure absolute distances by performing multi-wavelength interferometry (MWI) using four different wavelengths generated simultaneously from the frequency comb of a femtosecond laser. The measurement precision is estimated to be less than 63 nm in peak-to-valley over a distance of 1 m as compared to an incremental HeNe laser interferometer. We also evaluate the operational stability and robustness of the interferometer hardware system over a time period of 12 hours. Finally, it is concluded that the proposed frequency-comb-referenced multi-wavelength interferometry is capable of providing fast, precise and high stable absolute distance measurements, being well suited for industrial precision-engineering applications and near-future space missions.
机译:我们通过使用飞秒激光器的频率梳同时生成的四个不同波长执行多波长干涉测量(MWI),来测量绝对距离。与增量式HeNe激光干涉仪相比,在1 m距离内峰谷间的测量精度估计小于63 nm。我们还评估了干涉仪硬件系统在12小时内的运行稳定性和鲁棒性。最后,得出的结论是,所提出的频率梳参考多波长干涉仪能够提供快速,精确和高度稳定的绝对距离测量,非常适合于工业精密工程应用和近将来的太空飞行任务。

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