This paper describes a nanomanipulator system based on an atomic force microscope (AFM) for the measurement of the shear force of a single adhesion cell on a substrate. The shear force is measured based on the deflection of a self-sensitive cantilever that is employed for simple configuration of the AFM manipulator. The shear force behavior of a single cell detaching from the substrate is observed. The shear force of the cell increases with increasing size of the cell. Slight differences in the shear force of the single cell under different conditions can be successfully observed. The shear force of cells on a polystyrene dish treated for adhesion cells is higher than that of cells on a glass substrate dish. With respect to different buffers, the shear force of cells in the tested buffer containing Ca was significantly higher than that of cells in the buffer with no added Ca.
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