FXI: a full-field imaging beamline at NSLS-Ⅱ

摘要

The Full-field X-ray Imaging (FXI) beamline at the NSLS-Ⅱ is designed for optimum performance of a transmission x-ray microscope (TXM). When complete, FXI will enable the TXM to obtain individual 2D projection images at 30 ran spatial resolution and up to 40 microns field of view (FOV) with exposure times of ＜ 50 ms per image. A complete 3D nanotomography data set should take less than 1 minute. This will open opportunities for many real-time in-operando studies.