Mechanisms of MLCCs Insulation Resistance Degradation Under Highly Accelerated Temperature and Humidity Stress

摘要

In recent years, failure mechanisms under high temperature / high voltage conditions (HALT: highly accelerated life test) of monolithic ceramic capacitors (MLCCs) with Ni internal electrodes have been investigated. Generally, the insulation resistance degradation in HALT is attributed to electro-migration of oxygen vacancies. Additionally, reliability under high temperature / high humidity and rated-voltage environments is also important for MLCCs. However, only a few works have been conducted on the causes of insulation resistance degradation of MLCCs under these environments. Therefore, in this study, we investigate the failure mechanisms of MLCCs under highly accelerated temperature and humidity stress test (HAST). As a result, the insulation resistance degradation in HAST was considered to be due to the effect of hydrogen ions.