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Impact of ESD protection and power supply decoupling on 10 GHz low noise amplifier

机译:ESD保护和电源去耦对10 GHz低噪声放大器的影响

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An experimental study has been performed on the effect of 10 GHz LNAs with and without ESD protection. As well, simulations have been done to compare the effect of leaving out power supply decoupling capacitors with comparisons to measurements. For this study, two 10 GHz LNAs, one with and one without ESD protection were designed and implemented in 0.13 µm RFCMOS technology. Measured results of the LNAs showed that both have similar performance. The ESD test results showed that a Human Body Model (HBM) ESD protection threshold higher than 2 kV can be achieved without showing leakage and degradation of the S-parameters and noise figure, demonstrating that degradation of RF parameters can be minimized by choosing the appropriate ESD protection and by taking it into account early in the design process. This study also demonstrated that without on-chip power supply decoupling capacitors, the gain, matching, and noise are severely degraded.
机译:对有和没有ESD保护的10 GHz LNA的效果进行了实验研究。同样,已经进行了仿真以将省去电源去耦电容器的效果与测量结果进行比较。在本研究中,设计并采用0.13 µm RFCMOS技术实现了两个10 GHz LNA,一个带有ESD保护,一个没有ESD保护。 LNA的测量结果表明两者具有相似的性能。 ESD测试结果表明,可以实现高于2 kV的人体模型(HBM)ESD保护阈值,而不会出现S参数和噪声系数的泄漏和劣化,表明可以通过选择适当的参数来最大程度地降低RF参数的劣化ESD保护,并在设计过程的早期就将其考虑在内。这项研究还表明,如果没有片上电源去耦电容器,则增益,匹配和噪声会严重降低。

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