Improvement of offset short calibration technique in waveguide VNA measurement at millimeter and sub-millimeter wave frequency

摘要

This paper describes a new concept of calibration standards for waveguide Vector Network Analyzer (VNA) measurement in the millimeter and sub-millimeter wave frequency bands. High precision and traceable scattering parameter measurements have been achieved by using precision design of waveguide interface [1] and optimizing the measurement condition and setup of measurement system [2]. Even if using precision machining to make a precision waveguide, there is non-zero mechanical tolerance providing the degradation of connection repeatability. The National Metrology Institute of Japan (NMIJ) proposes to use the waveguide standard line with small size aperture compared to aperture size of test-port waveguides. This new concept provides to improve the connection repeatability coming from misalignment. Results of the both simulations and measurements are described, and then, comparison results between conventional and new concept standards are described.