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LLC converters: Beyond datasheets for MOSFET power loss estimation

机译:LLC转换器:超越MOSFET功率损耗估计的数据表

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In the past 10 years, LLC resonant converters have become a mainstream topology and multiple design tools have been developed, including LLC controllers, LLC tank regulation techniques, etc. While many design tools are available, methods of estimating power losses in LLC MOSFETs do not exist. In particular, accurate methods of estimating conduction losses, which are dominant in LLC converters, are lacking in the literature. This paper develops a method of accurately estimating MOSFET power losses in LLC converters. This is a fundamental tool for designing LLC converters, and allows the thermal behaviour of the MOSFETs to be predicted before the converter is built. The proposed method overcomes major datasheet limitations by replacing the poor, unrealistic datasheet information with a realistic MOSFET characterization applicable to LLC converters. The method focuses on the detailed characterization of the on-state resistance (RDS(on)), including the effects of the gate-source voltage (VgS), junction temperature (Tj) and drain current (ID). The characterization covers the actual operating points of the LLC converter, and provides an estimating equation to calculate MOSFET losses. As a result, LLC losses can be estimated with improved accuracy, including different operating points and ID polarities. As verified by simulation and experimental results, the proposed design tool provides an improvement in accuracy of over 100% compared to the results obtained using the simplistic datasheet information when the circuit is operating near resonant frequency.
机译:在过去的10年中,LLC谐振转换器已成为主流拓扑,已经开发了多种设计工具,包括LLC控制器,LLC罐调节技术等。虽然有许多设计工具,但估算LLC MOSFET中的功率损耗的方法不会存在。特别是,在文献中缺乏估计在LLC转换器中的导电损耗的准确方法。本文开发了一种准确地估计LLC转换器中MOSFET功率损耗的方法。这是设计LLC转换器的基本工具,并允许在构建转换器之前预测MOSFET的热行为。该方法通过使用适用于LLC转换器的现实MOSFET表征来克服主要数据表限制。该方法侧重于导通状态电阻的详细表征(R Ds 上的)),包括栅极源电压的影响(Vg s ),结温(t j )和漏极电流(i d )。表征涵盖了LLC转换器的实际操作点,并提供了计算MOSFET损耗的估计方程。结果,可以通过提高精度,包括不同的操作点和I D 极性来估计LLC损耗。如仿真和实验结果验证,所提出的设计工具与当电路在谐振频率接近谐振频率附近时获得的结果,提供了超过100 %的准确性提高。

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