CMOS image sensors; analogue-digital conversion; integrated circuit noise; 2-step composition; 4-input comparator; ADC measured conversion time; FPN reduction; Samsung CIS technology; TS SS ADC; VGA resolution; circuit operation; coarse block; column self-calibration technique; connection point; conversion speed; fine block; fixed pattern noise reduction; low-noise CIS; low-noise CMOS image sensor; size 0.13 mum; time 17 mus; two-step single-slope ADC; video system; word length 14 bit; Arrays; CMOS image sensors; Calibration; Image resolution; Noise; Random access memory; Semiconductor device measurement; CIS; self-calibration; two-step single slope ADC;
机译:低噪声CMOS图像传感器的两步A / D转换和列自校准技术
机译:用于CMOS图像传感器的12位高速列并行两步单斜率模数转换器(ADC)
机译:具有列并行两步单斜率ADC的高速CMOS图像传感器
机译:具有14位两步单斜率ADC的低噪声CMOS图像传感器和柱自校准技术
机译:适用于低功率传感器应用的可频率缩放的14位ADC。
机译:低噪声CMOS图像传感器的两步A / D转换和列自校准技术
机译:低噪声CmOs图像传感器的两步a / D转换和列自校准技术