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An approach towards selection of the oscillation frequency for oscillation test of analog ICs

机译:选择用于模拟IC的振荡测试的振荡频率的方法

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The paper deals with a new approach to selection of the optimum value of the oscillation frequency towards increasing the efficiency of the oscillation-based test methods in covering hard-detectable short faults in nanoscale technologies. For this purpose, the Describing-Function analysis was used to calculate of the oscillation frequency of a simple oscillator (an analog circuit under test) modeled in MATLAB. Accuracy of the model was evaluated through comparison of computed parameters to parameters achieved for the same circuit in Cadence.
机译:本文提出了一种选择最佳振荡频率值的新方法,以提高基于振荡的测试方法的效率,以覆盖纳米技术中难以检测到的短路故障。为此,使用描述函数分析来计算在MATLAB中建模的简单振荡器(被测模拟电路)的振荡频率。通过将计算出的参数与在Cadence中为同一电路实现的参数进行比较来评估模型的准确性。

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