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Microcontroller tracing in Hardware in the Loop tests integrating trace port measurement capability into NI VeriStand

机译:硬件在回路中的微控制器跟踪测试将跟踪端口测量功能集成到NI VeriStand中

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Developing software for safety critical embedded systems requires extensive testing, and HIL (Hardware in the Loop) test has one of the most important roles in this testing process. Modern microcontrollers can provide opportunities to improve the efficiency and capability of traditional HIL testing. Many of these opportunities are connected to their internal so called Trace interfaces. This paper shortly introduces the capabilities of these Trace interfaces, and presents the way to integrate them into a professional HIL test development environment the NI VeriStand. The integration process starts with the acquisition of Trace signals, which requires a high speed FPGA based solution, and then a way to capture and process the data at the VeriStand engine level (usually runs on a real-time target), and at the Workspace level (Host PC) is described. The paper ends with the conclusion, which analyzes the throughput and capabilities of the integrated Trace interface and shows the possible application of the data captured by it.
机译:为安全关键型嵌入式系统开发软件需要进行广泛的测试,并且HIL(硬件在循环中)测试在此测试过程中扮演着最重要的角色之一。现代微控制器可以提供提高传统HIL测试效率和功能的机会。这些机会很多都与其内部所谓的“跟踪”接口有关。本文简要介绍了这些Trace接口的功能,并提出了将它们集成到NI VeriStand的专业HIL测试开发环境中的方法。集成过程从获取跟踪信号开始,这需要基于FPGA的高速解决方案,然后是在VeriStand引擎级别(通常在实时目标上运行)和工作区捕获和处理数据的方法。级别(主机PC)进行说明。本文以结论结尾,该结论分析了集成的Trace接口的吞吐量和功能,并显示了其捕获的数据的可能应用。

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