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A SIMPLE APPLICATION OF CONJUGATE PROFILE THEORY TO THE DEVELOPMENT OF A SILICON MICRO TRIBOMETER

机译:共轭谱理论在硅微千分尺研制中的简单应用

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Although a certain amount of work has been presented in literature which concerns micro and nano tribology, few contributions have been dedicated to the development of experimental set up for friction assessment in MEMS. The present paper offers a contribution which attempts to fill this gap: the proposal of a new concept design of a micro-tribometer for testing silicon-silicon sliding in MEMS devices, particularly in those obtained via D-RIE process. Since the general contact conditions at the macro scale are very different from those which characterize MEMS, the proposed tribometer is very different from the classic pin-on-disk or block-on-ring. For this reason, a dedicated MEMS has been built, whose only purpose is recreating silicon-silicon sliding under prescribed loads and, then, assessing friction and wear. Since most of MEMS have planar relative motion, the tribometer presented in this article is able study only planar relative motions, and so it has been essentially based on a the creation of a pair of conjugate profiles, whose relative motion has been obtained by using Finite Element Analysis (FEA) simulations, rather than by the classical centrodes theory.
机译:尽管在文献中已经提出了涉及微米级和纳米级摩擦学的大量工作,但是很少有人致力于开发用于MEMS摩擦评估的实验装置。本文为弥补这一空白做出了贡献:提出了一种微摩擦计的新概念设计方案,用于测试MEMS器件中的硅-硅滑动,特别是通过D-RIE工艺获得的硅-硅滑动。由于宏观尺度上的一般接触条件与MEMS的接触条件有很大不同,因此拟议的摩擦计与经典的针上磁盘或环上模块大不相同。因此,已经建立了专用的MEMS,其唯一目的是在规定的载荷下重现硅-硅滑动,然后评估摩擦和磨损。由于大多数MEMS具有平面相对运动,本文介绍的摩擦计只能研究平面相对运动,因此它基本上是基于一对共轭轮廓的创建,它们的相对运动是通过使用Finite获得的。元素分析(FEA)模拟,而不是经典的中心理论。

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