首页> 外文会议>IEEE International New Circuits and Systems Conference >Modeling and characterization of CP-PLL phase noise in presence of dead zone
【24h】

Modeling and characterization of CP-PLL phase noise in presence of dead zone

机译:存在死区时CP-PLL相位噪声的建模和表征

获取原文

摘要

The analysis of non-linear mixed-signal systems like CP-PLLs is challenging because general theory of control systems cannot be applied easily. Therefore, CP-PLLs are designed within simulation platforms describing them on transistor-, behavioral-or linear-level. These models are often unprofitable according to the characterization capability, simulation time and computer resources when considering non-ideal effects. To avoid this, the modular and enhanced event-driven model can be used. Since this model is not applicable to combine phase noise and non-ideal effects, this paper focuses on modeling phase noise within the event-driven representation. Furthermore, an analytical description of the impact of dead zone on phase noise is given to obtain an optimized and robust system design.
机译:由于不能轻易应用控制系统的一般理论,因此对诸如CP-PLL之类的非线性混合信号系统的分析具有挑战性。因此,CP-PLL是在仿真平台内设计的,以晶体管,行为或线性级别对其进行了描述。考虑到非理想效果时,根据表征能力,仿真时间和计算机资源,这些模型通常无利可图。为了避免这种情况,可以使用模块化和增强的事件驱动模型。由于此模型不适用于组合相位噪声和非理想效应,因此本文着重于在事件驱动表示中建模相位噪声。此外,给出了死区对相位噪声的影响的分析描述,以获得优化且鲁棒的系统设计。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号