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A New Method for High Resolution Polarimetric SAR Data Classification Based on the M-Box Test

机译:一种基于M-Box测试的高分辨率偏振SAR数据分类方法

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Polarimetric radar backscattering is classically modeled as a multivariate Gaussian process. However, PolSAR data sets acquired by recent sensors with high resolution performance show some clutter heterogeneity, whose handling requires higher order representations. In this paper, the statistics of textured polarimetric images are modeled as a SIRV process. The comparison of the performance of the SIRV with respect to the classical Wishart distribution for the classification of real polarimetric SAR data clearly illustrates the strong sensitivity of the Wishart classification to the texture information, i.e. the backscattered intensity. In order to overcome this dependency, a new algorithm, based on the M-Box test, is proposed to classify pixels solely from their polarimetric properties.
机译:Polariemetric雷达反向散射经典建模为多变量高斯过程。然而,由具有高分辨率性能的最近传感器获取的POLSAR数据集显示了一些杂波异质性,其处理需要更高阶表示。在本文中,纹理偏振图像的统计数据被建模为SIRV过程。 SiRV对真实偏振SAR数据分类的经典Wishart分布的性能的比较清楚地示出了Wishart分类对纹理信息的强烈敏感性,即反向散射强度。为了克服这种依赖性,提出了一种基于M-Box测试的新算法,仅从它们的偏振属性分类像素。

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