An inverse scattering method based on the Surface Equivalent Principle and the use of Genetic Algorithms is presented in this contribution. This technique is used for the estimation of constitutive parameter of homogenous dielectrics with any permittivity and conductivity. The dielectric under test is illuminated with a set of plane waves at a single frequency, under 2D TM case assumption. The dielectric composition is estimated from the scattered field measured on a circumferential observation domain. Proper Genetic Algorithm tuning as well as inverse problem parameters coding have been tested by means of simulation examples.
展开▼
