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Simultaneous phase-shifting interferometry study based on the common-path Fizeau Interferometer

机译:基于共路径菲索干涉仪的同时相移干涉术研究

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A simultaneous phase-shifting interferometry(SPSI) based on the common-path Fizeau interferometer has been discussed In this system,two orthogonal polarized beams, using as the reference beam and test beam ,are detached by a particular Wollaston prism at a very small angle,then four equal sub-beams are achieved by a combination of three non-polarizing beam splitters(NPBS),and the phase shifts are introduced by four polarizers whose polarization azimuths are 0°,45°,90°, 135° with the horizontal direction respectively,the four phase shift interferograms are collected simultaneously by controlling the CCDs working at the same time .The SPSI principle is studied at first,then is the error analysis, finally we emulate the process of surface recovery by four steps phase shifts algorithm,the results indicate that, to ensure the feasibility of the SPSI system, we have to control the polarization azimuth error of the polarizer in ±0.5°.
机译:讨论了基于共路径菲索(Fizeau)干涉仪的同时相移干涉仪(SPSI)。在该系统中,两个正交偏振光束(分别用作参考光束和测试光束)被特定的沃拉斯顿棱镜以很小的角度分离然后,通过结合三个非偏振分束器(NPBS)来获得四个相等的子光束,并通过四个偏振角分别为0°,45°,90°,135°的偏振器引入相移通过分别控制CCD的同时工作来同时收集四个相移干涉图。首先研究SPSI原理,然后进行误差分析,最后通过四步相移算法模拟表面恢复过程,结果表明,为确保SPSI系统的可行性,我们必须将偏振器的偏振方位角误差控制在±0.5°。

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