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Conceptual design of a cryogenic test bench system for millimeter wavelength detectors

机译:用于毫米波波长检测器的低温测试台系统的概念设计

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We present the design of a cryogenic system for testing different technologies of millimeter wavelength detectors. The proposed design is developed at the Astronomical Instrumentation Laboratory for Millimeter Wavelength at the National Institute of Astrophysics, Optics and Electronics, in Mexico. The cryogenic system is integrated by a closed cycle pulse tube cooler with a 4 Kelvin 12 inches cold plate and a He-4/He-3 fridge and would be able to characterize KIDs (Kinetic Inductor Detectors), TES (Transition Edge Sensors) or semiconductor bolometers using a thermal link to a 250 mK stage. Readout electronics will be installed at the 4 Kelvin cold plate along with connectors and cables for the thermometry. In this paper we present a preliminary 3D model design which its main goal is to use efficiently the limited space in the cryostat with emphasis on the interchangeability for installing each time any of the three different detector technologies in the same cold plate; results for the thermal calculations and finite-element modeling are also shown. The system would allow, with some minor changes, to replace the He-4/He-3 fridge by a dilution fridge in order to reach temperatures about 100 mK to have more flexibility in the detector testing. The importance of the cryogenic test bench relies in the need for an easier and quicker characterization of detectors arrays as part of the research for the development of instruments for millimeter telescopes.
机译:我们介绍了一种低温系统的设计,用于测试毫米波波长检测器的不同技术。拟议的设计是在墨西哥国家天体物理学,光学和电子学研究所的毫米波天文学仪器实验室开发的。低温系统由一个带4开尔文12英寸冷板和He-4 / He-3冰箱的闭环脉冲管冷却器集成,并且能够表征KID(运动型电感器检测器),TES(过渡边缘传感器)或半导体辐射热计使用250 mK级的热链接。读数电子设备将与温度测量的连接器和电缆一起安装在4 Kelvin冷板上。在本文中,我们提出了一个初步的3D模型设计,其主要目标是有效利用低温恒温器中的有限空间,重点是可互换性,以便每次将三种不同检测器技术中的任何一种都安装在同一块冷板上。还显示了热计算和有限元建模的结果。该系统将进行一些微小的更改,即可用稀释冰箱代替He-4 / He-3冰箱,以达到约100 mK的温度,从而在检测器测试中具有更大的灵活性。低温测试台的重要性在于,需要更轻松,更快速地表征探测器阵列,这是开发毫米波望远镜仪器的研究的一部分。

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