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The GRAVITY metrology system: modeling a metrology in optical fibers

机译:GRAVITY计量系统:对光纤中的计量进行建模

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GRAVITY is the second generation VLT Interferometer (VLTI) instrument for high-precision narrow-angle astrometry and phase-referenced interferometric imaging. The laser metrology system of GRAVITY is at the heart of its astrometric mode, which must measure the distance of 2 stars with a precision of 10 micro-arcseconds. This means the metrology has to measure the optical path difference between the two beam combiners of GRAVITY to a level of 5 nm. The metrology design presents some non-common paths that have consequently to be stable at a level of 1 nm. Otherwise they would impact the performance of GRAVITY. The various tests we made in the past on the prototype give us hints on the components responsible for this error, and on their respective contribution to the total error. It is however difficult to assess their exact origin from only OPD measurements, and therefore, to propose a solution to this problem. In this paper, we present the results of a semi-empirical modeling of the fibered metrology system, relying on theoretical basis, as well as on characterisations of key components. The modeling of the metrology system regarding various effects, e.g., temperature, waveguide heating or mechanical stress, will help us to understand how the metrology behave. The goals of this modeling are to 1) model the test set-ups and reproduce the measurements (as a validation of the modeling), 2) determine the origin of the non-common path errors, and 3) propose modifications to the current metrology design to reach the required 1nm stability.
机译:GRAVITY是用于高精度窄角天文测量和相位参考干涉成像的第二代VLT干涉仪(VLTI)仪器。 GRAVITY的激光计量系统是其天文模式的核心,该系统必须以10微秒的精度测量2星的距离。这意味着计量必须将两个GRAVITY光束组合器之间的光程差测量到5 nm的水平。计量设计提出了一些非公共路径,因此必须在1 nm的水平上保持稳定。否则,它们会影响GRAVITY的性能。过去我们在原型上进行的各种测试都向我们提示了造成此错误的组件,以及它们各自对总错误的影响。然而,仅通过OPD测量来评估它们的确切来源是困难的,因此,提出针对该问题的解决方案。在本文中,我们基于理论基础以及关键组件的表征,介绍了光纤计量系统的半经验建模结果。关于各种影响(例如温度,波导加热或机械应力)的计量系统建模将有助于我们了解计量的行为。此建模的目标是:1)对测试设置进行建模并重现测量结果(作为对模型的验证); 2)确定非常见路径误差的来源; 3)建议对当前计量进行修改设计达到所需的1nm稳定性。

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