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Infrared ellipsometric spectroscopy of Mn_(1.56)Co_(0.96)Ni_(0.48)O_4 thin films with different layers

机译:Mn_(1.56)CO_(0.96)Ni_(0.48)O_4薄膜的红外线椭圆谱谱学用不同的层

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摘要

High quality Mn_(1.56)Co_(0.96)Ni_(0.48)O_4 films with different layers have been prepared on Pt//Ti/SiO_2/Si substrate. Infrared optical properties of the films have been investigated using infrared spectroscopic ellipsometry. The optical constants have been obtained by fitting the measured ellipsometric parameter data with classical infrared model.
机译:在PT // Ti / SiO_2 / Si衬底上制备具有不同层的高质量Mn_(1.56)CO_(0.96)o_4膜。使用红外光谱椭偏测量研究了膜的红外光学性质。通过用经典红外模型拟合测量的椭圆测量参数数据来获得光学常数。

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