首页> 外文会议>Chinese Control Conference >Numerical Calculation and Analysis of Transient Enclosure Voltage Rising Caused by Operating Disconnectors
【24h】

Numerical Calculation and Analysis of Transient Enclosure Voltage Rising Caused by Operating Disconnectors

机译:操作隔离开关引起的瞬态外壳电压上升数值计算与分析

获取原文
获取外文期刊封面目录资料

摘要

To assess the insulation coordination under transient condition of GIS and improve the operating reliability of power system, the transient enclosure voltage (TEV) rising caused by operating disconnectors is investigated in the paper. The principle of TEV in GIS is elaborated. TEV produced by disconnectors at 550 kV Dongqing GIS substation is calculated, the factors affecting TEV and possible harm caused by TEV are discussed.
机译:为了评估GIS瞬态条件下的绝缘性协调,提高电力系统的运行可靠性,在纸上研究了由操作隔离开关引起的瞬态外壳电压(TEV)。详细说明了GIS中TEV的原则。通过在550 kV东庆GIS变电站的断开器产生的TEV,讨论了影响TEV的因素和TEV造成的可能伤害。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号