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Noise analysis and measurement of integrator-based sensor interface circuits for fluorescence detection in lab-on-a-chip applications

机译:基于积分器的传感器接口电路噪声分析及测量,用于实验室应用中的荧光检测

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This paper examines the impact of integrator-based sensor interface circuit parameters, optical parameters, and noise on the limit of detection (LOD) of a fluorescence measurement lab-on-a-chip (LOC) device. Fluorescence detection is a powerful form of signal measurement for LOC-based bio-diagnostic assays. Reduction of the LOD enables a lower concentration of analyte to be measured, diversifying applications of LOC technology. An optical system model of a proposed LOC device is described. This device contains a photodiode and a capacitive transimpedance amplifier (CTIA) sensor interface constructed in a standard complementary metal-oxide-semiconductor (CMOS) technology. Analysis of the noise produced by the interface electronics and photodiode is then carried out, enabling the LOD of the system to be parametrized. The impact of circuit and system parameters on the LOD is then evaluated and compared to simulated and measured results.
机译:本文研究了基于集成器的传感器接口电路参数,光学参数和噪声对荧光测量实验室(LOC)设备的检测极限的影响。荧光检测是基于基因基因的生物诊断测定的强大的信号测量形式。 LOD的减少使得能够测量较低浓度的分析物,使LOC技术的应用多样化。描述了所提出的LOC装置的光学系统模型。该器件包含光电二极管和在标准互补金属氧化物半导体(CMOS)技术中构造的电容式跨阻抗放大器(CTIA)传感器界面。然后执行接口电子和光电二极管产生的噪声的分析,使得系统的床位能够参数化。然后评估电路和系统参数对LOD的影响,并与模拟和测量结果进行比较。

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