An Accurate and Comprehensive Soft Error Simulator NISES II

机译：准确和综合的软错误模拟器纳尼II

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The authors report an accurate and comprehensive soft error (SE) simulator NISES version II, which includes effects due to cosmic ray high-energy neutrons, thermal neutrons, and α - particles. NISES II covers SE analysis of DRAM, SRAM, and latch (or FF) circuits and it is also applicable for SE analysis of SOI circuits.

机译：作者报告了一种准确和全面的软错误（SE）模拟器NISINES II，其包括由于宇宙射线高能量中子，热中子和α - 颗粒引起的效果。 NISISE II涵盖DRAM，SRAM和闩锁（或FF）电路的SE分析，也适用于SOI电路的SE分析。

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《International Conference on Simulation of Semiconductor Processes and Devices》|2004年||共4页
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Y. Tosaka; S. Satoh; H. Oka; Munich University of Technology;
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入库时间 2022-08-21 10:41:29

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An Accurate and Comprehensive Soft Error Simulator NISES II

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